A BIST Structure for IP Multi-Slope A/D Converter Testing
نویسنده
چکیده
This paper proposes a static test approach suitable for built-in-self-test (BIST) of Analog-to-digital converter Intellectual Property (IP). Static parameters (INL, DNL, gain, offset) are tested without using test equipment. The proposed BIST structure is applicable for testing models of analog-to-digital converters up to 12bits of resolution. Comparison results with dynamic test equipment validates the proposed static test approach.
منابع مشابه
Efficient BIST scheme for A/D converters
As SOC and complex systems usually include analogue IPs, it becomes more important to test analogue devices efficiently. The reason for this is that analogue testing for high quality requires substantial testing costs although the analogue portion in a whole chip or in a system is usually very small. In the paper, an efficient low-cost built-in self-test (BIST) scheme is developed for testing A...
متن کاملBuilt-In Self-Test for Static ADC Testing with a Triangle-Wave
This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC’s static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead. key words: A...
متن کاملNoise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
This paper proposes a built-in self-test (BIST) scheme for noise-tolerant testing of a digital-to-analogue converter (DAC). The proposed BIST calculates the differences in output voltages between a DAC and test modules. These differences are used as the inputs of an integrator that determines integral nonlinearity (INL). The proposed method has an advantage of random noise cancelation and achie...
متن کاملA BIST Scheme for an SNR Test of a Sigma-Delta ADC
Built-In-Self-Test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-theeld diagnostics. This paper discusses a Mixed AnalogDigital BIST (MADBIST) for a Signal-to-Noise-Ratio test of an Analog-to-Digital Converter. The MADBIST strategy for the SNR test of the A/D Converter...
متن کاملAn Efficient BIST (Built-in Self-test) for A/D converters
Abstract A histogram-based built-in self-test (BIST) approach for deriving main characteristic parameters of an analog to digital converter (ADC) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method makes the hardw...
متن کامل